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Growth and interface of HfO[sub 2] films on H-terminated Si from a TDMAH and H[sub 2]O atomic layer deposition process

Growth and interface of HfO[sub 2] films on H-terminated Si from a TDMAH and H[sub 2]O atomic layer deposition process

Hackley, Justin C.; Demaree, J. Derek; Gougousi, Theodosia
  • 期刊名称Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
  • 作者Hackley, Justin C.; Demaree, J. Derek; Gougousi, Theodosia
  • 卷第26卷
  • 期第5期
  • 印刷ISSN0734-2101
  • 文件大小702.31KB
  • 发表时间2008
  • DOI10.1116/1.2965813
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