Growth and interface of HfO[sub 2] films on H-terminated Si from a TDMAH and H[sub 2]O atomic layer deposition process
Hackley, Justin C.; Demaree, J. Derek; Gougousi, Theodosia
- 期刊名称Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
- 作者Hackley, Justin C.; Demaree, J. Derek; Gougousi, Theodosia
- 卷第26卷
- 期第5期
- 印刷ISSN0734-2101
- 文件大小702.31KB
- 发表时间2008
- DOI10.1116/1.2965813