发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Robust Design-for-Productization Practices for High Quality Automotive Products

Bernardi, Paolo; Melchiori, Fabio; Pandini, Davide; Pugliese, Santo; Appello, Davide

作者Bernardi, Paolo; Melchiori, Fabio; Pandini, Davide; Pugliese, Santo; Appello, Davide
文件大小836.18KB
发表时间2008
DOI10.1109/test.2008.5483612
页码1-9