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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Modeling of majority and minority carrier triggered external latchup

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Modeling of majority and minority carrier triggered external latchup

Farbiz, Farzan; Rosenbaum, Elyse
  • 作者Farbiz, Farzan; Rosenbaum, Elyse
  • 文件大小342.51KB
  • 发表时间2008
  • DOI10.1109/relphy.2008.4558897
  • 页码270-277
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