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[IEEE 2008 Conference on Precision Electromagnetic Measurements (CPEM 2008) - Broomfield, CO, USA (2008.06.8-2008.06.13)] 2008 Conference on Precision Electromagnetic Measurements Digest - Design and fabrication of high value standard resistors at INTI

[IEEE 2008 Conference on Precision Electromagnetic Measurements (CPEM 2008) - Broomfield, CO, USA (2008.06.8-2008.06.13)] 2008 Conference on Precision Electromagnetic Measurements Digest - Design and fabrication of high value standard resistors at INTI

Bierzychudek, M.; Garcia, R.; Real, M.; Tonina, A.

作者Bierzychudek, M.; Garcia, R.; Real, M.; Tonina, A.
文件大小701.56KB
发表时间2008
DOI10.1109/cpem.2008.4574820
页码396-397

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