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[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Performance-Constrained Different Cell Count Minimization for Continuously-Sized Circuits

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Performance-Constrained Different Cell Count Minimization for Continuously-Sized Circuits

Yoshida, Hiroaki; Fujita, Masahiro

作者Yoshida, Hiroaki; Fujita, Masahiro
文件大小187.24KB
发表时间2008
DOI10.1109/date.2008.4484924
页码1099-1102

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