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[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - A Basis for Formal Robustness Checking

[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - A Basis for Formal Robustness Checking

Fey, Goerschwin; Drechsler, Rolf

作者Fey, Goerschwin; Drechsler, Rolf
文件大小238.02KB
发表时间2008
DOI10.1109/isqed.2008.4479838
页码784-789

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