Electrical characteristics of MOSFETs with La2O3/Y2O3 gate stack

Parhat Ahmet; Kentaro Nakagawa; Kuniyuki Kakushima; Hiroshi Nohira; Kazuo Tsutsui; Nobuyuki Sugii; Takeo Hattori; Hiroshi Iwai

作者Parhat Ahmet; Kentaro Nakagawa; Kuniyuki Kakushima; Hiroshi Nohira; Kazuo Tsutsui; Nobuyuki Sugii; Takeo Hattori; Hiroshi Iwai
卷第48卷
印刷ISSN0026-2714
文件大小323.73KB
发表时间2008
DOI10.1016/j.microrel.2008.09.004
页码1769-1771

发现好书期刊，享受阅读乐趣