[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Characteristics of TiSiO Films for Varistors
- 作者Lim, Jung Wook; Yun, Sun Jin; Kim, Hyun-Tak
- 卷第16卷
- 文件大小317.88KB
- 发表时间2008
- DOI10.1149/1.2980009
- 页码337-341
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