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[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Quantum Properties of Defects in Silicon Films

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Quantum Properties of Defects in Silicon Films

Milovzorov, Dmitry E.

作者Milovzorov, Dmitry E.
卷第16卷
文件大小342.09KB
发表时间2008
DOI10.1149/1.2980298
页码121-126

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