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Methods of charge-state analysis of fast ions inside matter based on their X-ray spectral distributionROSMEJ, F.B.; MORE, R.; ROSMEJ, O.N.; WIESER, J.; BORISENKO, N.; SHEVELKO, V.P.; GEIßEL, M.; BLAZEVIC, A.; JACOBY, J.; DEWALD, E.; ROTH, M.; BRAMBRINK, E.; WEYRICH, K.; HOFFMANN, D.H.H.; GOLUBEV, A.A.; TURTIKOV, V.; FERTMAN, A.; SHARKOV, B.YU.; FAENOV, A.YA.; PIKUZ, T.A.; MAGUNOV, A.I.; SKOBELEV, I.YU. · Laser and Particle Beams · 2002