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[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults

[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults

Chun, Sunghoon; Kim, Yongjoon; Kim, Taejin; Yang, Myung-Hoon; Kang, Sungho

作者Chun, Sunghoon; Kim, Yongjoon; Kim, Taejin; Yang, Myung-Hoon; Kang, Sungho
文件大小740.34KB
发表时间2008
DOI10.1109/ats.2008.57
页码83-88

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