In-situ XTEM Analysis of the Liquid Phase Epitaxial Growth of a-Si/Au alloy layer
Venkatachalam, DK; Llewellyn, DJ; Belay, KB; Elliman, RG; Sood, DK; Bhargava, SK
- 期刊名称Microscopy and Microanalysis
- 作者Venkatachalam, DK; Llewellyn, DJ; Belay, KB; Elliman, RG; Sood, DK; Bhargava, SK
- 卷第14卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小462.03KB
- 发表时间2008-8
- DOI10.1017/s1431927608086479
- 页码1338-1339