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SPIE Proceedings [SPIE Seventh International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 10 October 2008)] Seventh International Symposium on Instrumentation and Control Technology: Measurement Theory and Systems and Aeronautical Equipment - Performance of wavelet analysis and neural network for detection and diagnosis of rotating machine fault

SPIE Proceedings [SPIE Seventh International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 10 October 2008)] Seventh International Symposium on Instrumentation and Control Technology: Measurement Theory and Systems and Aeronautical Equipment - Performance of wavelet analysis and neural network for detection and diagnosis of rotating machine fault

Kang, Shanlin; Fang, Jiancheng; Wang, Zhongyu; Kang, Yuzhe; Chen, Jingwei
  • 作者Kang, Shanlin; Fang, Jiancheng; Wang, Zhongyu; Kang, Yuzhe; Chen, Jingwei
  • 卷第7128卷
  • 印刷ISSN0277-786X
  • 文件大小235.09KB
  • 发表时间2008
  • DOI10.1117/12.806444
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