Spectroscopic ellipsometry analysis of multilayered TiO2-Ag thin films for photochromic application
- 作者L. Miao; T. Jiang; S. Tanemura; M. Tanemura; N. Nabatova-Gabain; G. Xu
- 卷第5卷
- 期第5期
- 印刷ISSN1610-1634
- 电子ISSN1610-1642
- 文件大小490.54KB
- 发表时间2008
- DOI10.1002/pssc.200777759
- 页码1125-1128
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