[AIP CT2008: TOMOGRAPHY CONFLUENCE: An International Conference on the Applications of Computerized Tomography - Kanpur (India) (15–17 February 2009)] AIP Conference Proceedings - Ultra Fast Scanned Electron Beam X-Ray CT for Two-Phase Flow Measurement
- 作者Hampel, Uwe; Fischer, Frank; Schleicher, Eckhard; Hoppe, Dietrich; Munshi, Prabhat
- 卷第1050卷
- 文件大小3026.60KB
- 发表时间2008
- DOI10.1063/1.2999982
- 页码144-150
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