Risk Management Principles for Nanotechnology
- 作者Gary E. Marchant; Douglas J. Sylvester; Kenneth W. Abbott
- 卷第2卷
- 期第1期
- 印刷ISSN1871-4757
- 电子ISSN1871-4765
- 文件大小321.21KB
- 发表时间2008-04
- DOI10.1007/s11569-008-0028-9
- 页码43-60
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