Three-dimensional imaging of short-range chemical forces with picometre resolution

• 作者Albers, Boris J.; Schwendemann, Todd C.; Baykara, Mehmet Z.; Pilet, Nicolas; Liebmann, Marcus; Altman, Eric I.; Schwarz, Udo D.
• 卷第4卷
• 期第5期
• 印刷ISSN1748-3387
• 电子ISSN1748-3395
• 文件大小535.32KB
• 发表时间2009
• DOI10.1038/nnano.2009.57
• 页码307-310