Semi-automatic tuning of PID gains for atomic force microscopes
- 作者Daniel Y. Abramovitch; Storrs Hoen; Richard Workman
- 卷第11卷
- 期第2期
- 印刷ISSN1561-8625
- 电子ISSN1934-6093
- 文件大小302.94KB
- 发表时间2009
- DOI10.1002/asjc.95
- 页码188-195
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