Simulated SMOS Levels 2 and 3 Products: The Effect of Introducing ARGO Data in the Processing Chain and Its Impact on the Error Induced by the Vicinity of the Coast

• 作者Talone, M.; Camps, A.; Mourre, B.; Sabia, R.; Vall-llossera, M.; Gourrion, J.; Gabarro, C.; Font, J.
• 卷第47卷
• 期第9期
• 印刷ISSN0196-2892
• 电子ISSN1558-0644
• 文件大小1586.95KB
• 发表时间2009
• DOI10.1109/tgrs.2008.2011618
• 页码3041-3050