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Using Accelerated Life Tests Results to Predict Product Field Reliability

Using Accelerated Life Tests Results to Predict Product Field Reliability

Meeker, William Q.; Escobar, Luis A.; Hong, Yili

期刊名称Technometrics
作者Meeker, William Q.; Escobar, Luis A.; Hong, Yili
卷第51卷
期第2期
印刷ISSN0040-1706
电子ISSN1537-2723
文件大小1177.42KB
发表时间2009-05
DOI10.1198/TECH.2009.0016
页码146-161

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