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Effects of Si-rich oxide layer stoichiometry on the structural and optical properties of Si QD
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SiO
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multilayer films

Effects of Si-rich oxide layer stoichiometry on the structural and optical properties of Si QD / SiO ₂ multilayer films

Hao, X J; Podhorodecki, A P; Shen, Y S; Zatryb, G; Misiewicz, J; Green, M A

期刊名称Nanotechnology
作者Hao, X J; Podhorodecki, A P; Shen, Y S; Zatryb, G; Misiewicz, J; Green, M A
卷第20卷
期第48期
印刷ISSN0957-4484
电子ISSN1361-6528
文件大小2260.98KB
发表时间2009-12-02
DOI10.1088/0957-4484/20/48/485703

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