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On the Exploitation of Narrow-Width Values for Improving Register File Reliability

On the Exploitation of Narrow-Width Values for Improving Register File Reliability

Jie Hu, ; Shuai Wang, ; Ziavras, S.G.

期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
作者Jie Hu, ; Shuai Wang, ; Ziavras, S.G.
卷第17卷
期第7期
印刷ISSN1063-8210
电子ISSN1557-9999
文件大小1027.95KB
发表时间2009-07
DOI10.1109/TVLSI.2009.2017441
页码953-963

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