[IEEE 2009 10th International Conference on Document Analysis and Recognition - Barcelona, Spain (2009.07.26-2009.07.29)] 2009 10th International Conference on Document Analysis and Recognition - Global Features for the Off-Line Signature Verification Problem
Nguyen, Vu; Blumenstein, Michael; Leedham, Graham
- 作者Nguyen, Vu; Blumenstein, Michael; Leedham, Graham
- 文件大小789.17KB
- 发表时间2009
- DOI10.1109/icdar.2009.123
- 页码1300-1304