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[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections

Chun, Sunghoon; Kim, Yongjoon; Kim, Taejin; Kang, Sungho

作者Chun, Sunghoon; Kim, Yongjoon; Kim, Taejin; Kang, Sungho
文件大小1459.13KB
发表时间2009
DOI10.1109/vts.2009.38
页码152-157

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