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$Thickness and Refractive Index Measurements by Full-Field Optical Coherence Microscopy$

Thickness and Refractive Index Measurements by Full-Field Optical Coherence Microscopy

Na, Jihoon; Choi, Woo June; Choi, Hae Young; Ryu, Seon Young; Choi, Eun Seo; Lee, Byeong Ha

期刊名称IEEE Sensors Journal
作者Na, Jihoon; Choi, Woo June; Choi, Hae Young; Ryu, Seon Young; Choi, Eun Seo; Lee, Byeong Ha
卷第9卷
期第12期
印刷ISSN1530-437X
电子ISSN1558-1748
文件大小215.63KB
发表时间2009-12
DOI10.1109/jsen.2009.2031808
页码1996-1997

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