[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - A Reconfigurable ADC Circuit with Online-Testing Capability and Enhanced Fault Tolerance
- 作者Gao, Yueran; Wang, Haibo
- 文件大小552.93KB
- 发表时间2009
- DOI10.1109/dft.2009.31
- 页码202-210
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