General Framework for Single Event Effects Rate Prediction in Microelectronics
- 期刊名称IEEE Transactions on Nuclear Science
- 作者Weller, Robert A.; Reed, Robert A.; Warren, Kevin M.; Mendenhall, Marcus H.; Sierawski, Brian D.; Schrimpf, Ronald D.; Massengill, Lloyd W.
- 卷第56卷
- 期第6期
- 印刷ISSN0018-9499
- 电子ISSN1558-1578
- 文件大小356.88KB
- 发表时间2009-12
- DOI10.1109/TNS.2009.2033916
- 页码3098-3108
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