Electromagnetic immunity model of an ADC for microcontroller’s reliability improvement
- 作者Jean-Baptiste Gros; Geneviève Duchamp; Alain Meresse; Jean-Luc Levant
- 卷第49卷
- 印刷ISSN0026-2714
- 文件大小692.54KB
- 发表时间2009
- DOI10.1016/j.microrel.2009.06.013
- 页码963-966
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