Random Telegraph Noise Effect on the Programmed Threshold-Voltage Distribution of Flash Memories
- 期刊名称IEEE Electron Device Letters
- 作者Compagnoni, C.M.; Ghidotti, M.; Lacaita, A.L.; Spinelli, A.S.; Visconti, A.
- 卷第30卷
- 期第9期
- 印刷ISSN0741-3106
- 电子ISSN1558-0563
- 文件大小118.38KB
- 发表时间2009-09
- DOI10.1109/led.2009.2026658
- 页码984-986
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