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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Enabling GSM/GPRS/EDGE EVM testing on low cost multi-site testers

[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Enabling GSM/GPRS/EDGE EVM testing on low cost multi-site testers

Lai, Bobby; Rivera, Chris; Waheed, Khurram

作者Lai, Bobby; Rivera, Chris; Waheed, Khurram
文件大小785.79KB
发表时间2009
DOI10.1109/test.2009.5355626
页码1-7

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