Characterization of NiO thin film grown by two-step processes
Xin Wang; Ye Li; GuoZheng Wang; Rong Xiang; DeLong Jiang; ShenCheng Fu; Kui Wu; XiaoYu Yang; QingDuo DuanMu; JingQuan Tian; LiChen Fu
- 作者Xin Wang; Ye Li; GuoZheng Wang; Rong Xiang; DeLong Jiang; ShenCheng Fu; Kui Wu; XiaoYu Yang; QingDuo DuanMu; JingQuan Tian; LiChen Fu
- 卷第404卷
- 印刷ISSN0921-4526
- 文件大小252.14KB
- 发表时间2009
- DOI10.1016/j.physb.2008.10.059
- 页码1058-1060