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[IEEE 2009 3rd IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications (MAPE) - Beijing, China (2009.10.27-2009.10.29)] 2009 3rd IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications - The design of a multifunctional test apparatus-LISN Used for conduction interference testing

[IEEE 2009 3rd IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications (MAPE) - Beijing, China (2009.10.27-2009.10.29)] 2009 3rd IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications - The design of a multifunctional test apparatus-LISN Used for conduction interference testing

Yue, Lingling; Zhang, Xiaodong

作者Yue, Lingling; Zhang, Xiaodong
文件大小158.40KB
发表时间2009
DOI10.1109/mape.2009.5355760
页码862-864

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