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[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Soft Core Embedded Processor Based Built-In Self-Test of FPGAs

[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Soft Core Embedded Processor Based Built-In Self-Test of FPGAs

Dutton, Bradley F.; Stroud, Charles E.

作者Dutton, Bradley F.; Stroud, Charles E.
文件大小354.07KB
发表时间2009
DOI10.1109/dft.2009.51
页码29-37

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