$studied by resonant soft x-ray diffraction$

studied by resonant soft x-ray diffraction

Fink, Jörg; Schierle, Enrico; Weschke, Eugen; Geck, Jochen; Hawthorn, David; Soltwisch, Viktor; Wadati, Hiroki; Wu, Hsueh-Hung; Dürr, Hermann A.; Wizent, Nadja; Büchner, Bernd; Sawatzky, George A.

期刊名称Physical Review B
作者Fink, Jörg; Schierle, Enrico; Weschke, Eugen; Geck, Jochen; Hawthorn, David; Soltwisch, Viktor; Wadati, Hiroki; Wu, Hsueh-Hung; Dürr, Hermann A.; Wizent, Nadja; Büchner, Bernd; Sawatzky, George A.
卷第79卷
期第10期
印刷ISSN1098-0121
电子ISSN1550-235X
文件大小435.10KB
发表时间2009-3-4
DOI10.1103/PhysRevB.79.100502

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studied by resonant soft x-ray diffraction