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[IEEE 2009 IEEE Electrical Insulation Conference (EIC) (Formerly EIC/EME) - Montreal, QC, Canada (2009.05.31-2009.06.3)] 2009 IEEE Electrical Insulation Conference - Electrical ageing test on conventional and nanocomposite enamels: PD patterns analysis

[IEEE 2009 IEEE Electrical Insulation Conference (EIC) (Formerly EIC/EME) - Montreal, QC, Canada (2009.05.31-2009.06.3)] 2009 IEEE Electrical Insulation Conference - Electrical ageing test on conventional and nanocomposite enamels: PD patterns analysis

Guastavino, F.; Coletti, G.; Ratto, A.; Torello, E.

作者Guastavino, F.; Coletti, G.; Ratto, A.; Torello, E.
文件大小450.01KB
发表时间2009
DOI10.1109/eic.2009.5166404
页码537-541

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