[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - Multi-tone Testing of Linear and Nonlinear Analog Circuits Using Polynomial Coefficients
- 作者Sindia, Suraj; Singh, Virendra; Agrawal, Vishwani D.
- 文件大小338.89KB
- 发表时间2009
- DOI10.1109/ats.2009.45
- 页码63-68
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