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Role of shallow Si/SiO[sub 2] interface states on high frequency channel noise in n-channel metal-oxide-semiconductor field effect transistors

Role of shallow Si/SiO[sub 2] interface states on high frequency channel noise in n-channel metal-oxide-semiconductor field effect transistors

Su, Hao; Wang, Hong; Xu, Tao; Zeng, Rong
  • 期刊名称Applied Physics Letters
  • 作者Su, Hao; Wang, Hong; Xu, Tao; Zeng, Rong
  • 卷第95卷
  • 期第12期
  • 印刷ISSN0003-6951
  • 文件大小406.82KB
  • 发表时间2009
  • DOI10.1063/1.3231924
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