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[IEEE 2009 International Conference on Computer Engineering and Technology (ICCET) - Singapore, Singapore (2009.01.22-2009.01.24)] 2009 International Conference on Computer Engineering and Technology - Frequency Domain Testing: A New Approach in Online Test of VLSI Digital Signal Processing Systems

[IEEE 2009 International Conference on Computer Engineering and Technology (ICCET) - Singapore, Singapore (2009.01.22-2009.01.24)] 2009 International Conference on Computer Engineering and Technology - Frequency Domain Testing: A New Approach in Online Test of VLSI Digital Signal Processing Systems

Yousefi, R.; Jalili, A.; Fakhraie, S.M.

作者Yousefi, R.; Jalili, A.; Fakhraie, S.M.
文件大小192.87KB
发表时间2009
DOI10.1109/iccet.2009.198
页码136-140

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