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Root-Finding Methods for Assessing SRAM Stability in the Presence of Random Dopant Fluctuations

Root-Finding Methods for Assessing SRAM Stability in the Presence of Random Dopant Fluctuations

Kanj, Rouwaida; Li, Zhuo; Joshi, Rajiv V.; Liu, Frank; Nassif, Sani R.
  • 期刊名称IEEE Transactions on Semiconductor Manufacturing
  • 作者Kanj, Rouwaida; Li, Zhuo; Joshi, Rajiv V.; Liu, Frank; Nassif, Sani R.
  • 卷第22卷
  • 期第1期
  • 印刷ISSN0894-6507
  • 文件大小1154.60KB
  • 发表时间2009-02
  • DOI10.1109/tsm.2008.2011662
  • 页码22-30
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