Root-Finding Methods for Assessing SRAM Stability in the Presence of Random Dopant Fluctuations
Kanj, Rouwaida; Li, Zhuo; Joshi, Rajiv V.; Liu, Frank; Nassif, Sani R.
- 期刊名称IEEE Transactions on Semiconductor Manufacturing
- 作者Kanj, Rouwaida; Li, Zhuo; Joshi, Rajiv V.; Liu, Frank; Nassif, Sani R.
- 卷第22卷
- 期第1期
- 印刷ISSN0894-6507
- 文件大小1154.60KB
- 发表时间2009-02
- DOI10.1109/tsm.2008.2011662
- 页码22-30