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[IEEE 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Windsor, United Kingdom (2009.09.4-2009.09.6)] 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Value Driven Testing

[IEEE 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Windsor, United Kingdom (2009.09.4-2009.09.6)] 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Value Driven Testing

Sneed, Harry
  • 作者Sneed, Harry
  • 文件大小290.09KB
  • 发表时间2009
  • DOI10.1109/taicpart.2009.13
  • 页码157-166
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