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Depth-dependent critical behavior in

Del Genio, Charo I.; Trenkler, Johann; Bassler, Kevin E.; Wochner, Peter; Haeffner, Dean R.; Reiter, George F.; Bai, Jianming; Moss, Simon C.

期刊名称Physical Review B
作者Del Genio, Charo I.; Trenkler, Johann; Bassler, Kevin E.; Wochner, Peter; Haeffner, Dean R.; Reiter, George F.; Bai, Jianming; Moss, Simon C.
卷第79卷
期第18期
印刷ISSN1098-0121
电子ISSN1550-235X
文件大小103.71KB
发表时间2009-5-29
DOI10.1103/physrevb.79.184113