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[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - A study bipolar phototransistor action existing in CMOS process triggered by a laser beam used in a C-AFM system

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - A study bipolar phototransistor action existing in CMOS process triggered by a laser beam used in a C-AFM system

Hung-Sung Lin, ; Mong-Sheng Wu, ; Tsui-Hua Huang,

作者Hung-Sung Lin, ; Mong-Sheng Wu, ; Tsui-Hua Huang,
文件大小452.41KB
发表时间2009
DOI10.1109/irps.2009.5173353
页码801-803

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