Three-Step Room-Temperature Cleaning of Bare Silicon Surface for Radical-Reaction-Based Semiconductor Manufacturing
Hasebe, Rui; Teramoto, Akinobu; Kuroda, Rihito; Suwa, Tomoyuki; Sugawa, Shigetoshi; Ohmi, Tadahiro
- 期刊名称Journal of The Electrochemical Society
- 作者Hasebe, Rui; Teramoto, Akinobu; Kuroda, Rihito; Suwa, Tomoyuki; Sugawa, Shigetoshi; Ohmi, Tadahiro
- 卷第156卷
- 期第1期
- 印刷ISSN0013-4651
- 文件大小703.79KB
- 发表时间2009
- DOI10.1149/1.2993153