[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Interfacial Dipole Measurement of Dielectric/Silicon Interface by X-ray Photoelectron Spectroscopy
- 作者Kakushima, Kuniyuki; Okamoto, Kouichi; Tachi, Kiichi; Sato, Soushi; Song, Jaeyeol; Kawanago, Takamasa; Ahmet, Parhat; Sugii, Nobuyuki; Tsutsui, Kazuo; Hattori, Takeo; Iwai, H.
- 文件大小318.75KB
- 发表时间2009
- DOI10.1149/1.3100622
- 页码11-15
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