[ECS 2009 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT) - Xi'an, China (July 5 - July 10, 2009)] ECS Transactions - 16kb Phase Change Memory Test Chip with 0.18-μm Process
- 作者Ding, Sheng; Song, Zhitang; Liu, Bo; Cai, Daolin; Chen, Xiaogang; Chen, Yifeng; Zhong, Min; Feng, Gaoming; Xu, Chen; Feng, Songlin; Xie, Zhifeng; Yang, Zuoya; Wan, Xudong; Zhang, Fuxiong; Wu, Guanpin; Xiang, Yanghui
- 文件大小1487.65KB
- 发表时间2009
- DOI10.1149/1.3152969
- 页码133-144
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