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Circuit optimization techniques to mitigate the effects of soft errors in combinational logic

Circuit optimization techniques to mitigate the effects of soft errors in combinational logic

Rao, Rajeev R.; Joshi, Vivek; Blaauw, David; Sylvester, Dennis
  • 期刊名称ACM Transactions on Design Automation of Electronic Systems
  • 作者Rao, Rajeev R.; Joshi, Vivek; Blaauw, David; Sylvester, Dennis
  • 卷第15卷
  • 期第1期
  • 印刷ISSN1084-4309
  • 文件大小845.51KB
  • 发表时间2009-12-01
  • DOI10.1145/1640457.1640462
  • 页码1-27
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