SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications - Wavelength calibration and spectral line bending determination of an imaging spectrometer
- 作者Chen, Yuheng; Zhang, Kun; Wang, Xiang-jun; Ji, Yiqun; Zhou, Jiankang; Zhang, Guang-jun; Ai, Ke-cong; Chen, Xinhua; Wei, XiaoXiao; Shen, Weimin
- 卷第7384卷
- 印刷ISSN0277-786X
- 文件大小1276.31KB
- 发表时间2009
- DOI10.1117/12.835557
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