The Energy-Driven Hot Carrier Degradation Modes of nMOSFETs
Guerin, C.; Huard, V.; Bravaix, A.
- 期刊名称IEEE Transactions on Device and Materials Reliability
- 作者Guerin, C.; Huard, V.; Bravaix, A.
- 印刷ISSN1530-4388
- 文件大小643.57KB
- 发表时间2009
- DOI10.1109/tdmr.2007.898084