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Development and Psychometric Testing of the Brief Pain Inventory

Development and Psychometric Testing of the Brief Pain Inventory

Lee, John Y.K.; Chen, H. Isaac; Urban, Chris; Hojat, Anajita; Church, Ephraim; Farrar, John T.
  • 期刊名称Neurosurgery
  • 作者Lee, John Y.K.; Chen, H. Isaac; Urban, Chris; Hojat, Anajita; Church, Ephraim; Farrar, John T.
  • 卷第65卷
  • 期第2期
  • 印刷ISSN0148-396X
  • 文件大小574.02KB
  • 发表时间2009-08
  • DOI10.1227/01.neu.0000358712.64691.4c
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