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[IEEE 2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009) - Yasmine Hammamet, Tunisia (2009.12.13-2009.12.16)] 2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009) - Degradation-aware analog design flow for lifetime yield analysis and optimization

[IEEE 2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009) - Yasmine Hammamet, Tunisia (2009.12.13-2009.12.16)] 2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009) - Degradation-aware analog design flow for lifetime yield analysis and optimization

Pan, Xin; Graeb, Helmut

作者Pan, Xin; Graeb, Helmut
文件大小150.97KB
发表时间2009
DOI10.1109/ICECS.2009.5410811
页码667-670

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